The safety test cabinets PA 50* are designed for high-voltage testing of components and PCB's etc.
For high-voltage testing of components, DUTs are available for various pulse generators. The use of these DUTs significantly reduces placement times and significantly increases throughput.
The capacitive Coupling-/Decoupling Network CDN 10216 & 12216 is used in combination with the Surge generators PG 7-250, PG 10-504 or PG 12-804 and allows superimposition of surge test pulses to the single-phase power supply voltage of the device under test. The test set-up is suitable for immunity testing of electronic systems and devices according to IEC 61000-4-4, IEC 61000-4-5 and IEEE 587.
The capacitive Coupling-/Decoupling Networks CDN 2402/2410 are used in combination with the Multi-CE5 and allows superimposition of surge and burst test pulses to up to four I/O signal lines. The test set-up is suitable for surge immunity testing of electronic systems and devices according to IEC 61000-4-4, IEC 61000-4-5 and IEEE 587.
The capacitive Coupling-/Decoupling Network CDN 2802 is used in combination with the Multi-CE5 & Multi-CE7 and allows superimposition of surge and burst test pulses to up to eight I/O signal lines.
These measuring systems are used for the optical, digital transmission of analog signals:
The Surge Sense has been developed with EMC test laboratories in mind to enable a “go / no-go” verification of the surge generator output prior to test.
The Trans Sense has been developed with EMC test laboratories in mind to enable a “go/no-go” verification of the transient generator output prior to the test.
The VDips-Sense has been developed with EMC test laboratories in mind to enable a “go / no-go” verification of the Voltage Dip generator output prior to test.
CISPR 32 Annex C section C.2.2.1 contains a requirement to identify emissions that are intermittent in nature and apply timing criteria to determine if the emission complies with the standard, irrespective of level.