Call For More Details: +1 (703) 774-7505
Phone : +1 (703) 774-7505
IEC 62132-8
Categories
-
Automotive +
- BMW GS 95002-3
- CISPR 12
- CISPR 25 (EN 55025)
- FMC1278
- FMC1280
- GM W 3097
- IEC 61851-21-1
- IEC 61851-23
- ISO 11452-2
- ISO 11452-3
- ISO 11452-4
- ISO 11452-5
- ISO 11452-8
- ISO 11452-9
- ISO 16750-2
- ISO 21498
- ISO 7637-2
- ISO 7637-3
- ISO 7637-4
- LV 123
- LV 124
- LV 148
- MBN 11123
- PSA B21 7112
- SAE J 1113/2
- SAE J1752/3
- UN ECE R10
- VW 80300
- VW 80303
-
Component +
-
International Product Standards +
- CISPR 14-1 (EN 55014-1)
- CISPR 14-2 (EN 55014-2)
- CISPR 15 (EN 55015)
- CISPR 22 (EN 55022)
- CISPR 24 (EN 55024)
- CISPR 25 (EN 55025)
- CISPR 32 (EN 55032)
- CISPR 35 (EN 55035)
- EN 55103
- IEC 60060-2
- IEC 60065
- IEC 61643-11
- IEC/EN 50561-1
- IEC/EN 50561-3
- IEC/EN 61000-4-20
- IEC/EN 61000-6-1
- IEC/EN 61000-6-2
- IEC/EN 61543
- ISO 14708-3
-
International Test Standards +
- ANSI C63.16 ESD
- ANSI C63.4
- ANSI C63.5
- ANSI/IEEE C62.41
- CISPR 16-1-1
- CISPR 16-1-2
- CISPR 16-1-4
- CISPR 17
- CISPR 22 (EN 55022)
- CISPR 32 (EN 55032)
- IEC 60
- IEC/EN 61000-3-11
- IEC/EN 61000-3-12
- IEC/EN 61000-3-2
- IEC/EN 61000-3-3
- IEC/EN 61000-4-10
- IEC/EN 61000-4-11
- IEC/EN 61000-4-12
- IEC/EN 61000-4-16
- IEC/EN 61000-4-18
- IEC/EN 61000-4-19
- IEC/EN 61000-4-2
- IEC/EN 61000-4-29
- IEC/EN 61000-4-3
- IEC/EN 61000-4-34
- IEC/EN 61000-4-39
- IEC/EN 61000-4-4
- IEC/EN 61000-4-5
- IEC/EN 61000-4-6
- IEC/EN 61000-4-8
- IEC/EN 61000-4-9
- IEEE 1309
-
Military & Avionics +
-
Safety +
-
Telecom/Wireless +
IEC 62132-8
Integrated circuits – Measurement of electromagnetic immunity, 150 kHz up to 3 GHz – Part 8: Measurement of radiated immunity – IC stripline method
IEC 62132-8:2012 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances over the frequency range of 150 kHz to 3 GHz.
OTHER PRODUCTS IN THE SAME STANDARD:
TEM-6000 STRIPLINE Mod.2020 is a 6 GHz IC Stripline TEM Cell to generate EM fields for testing sample IC devices. It meets the requirements of IEC 61967-2/8, IEC 62132-8 and SAE 1752-3
GET QUOTE
