
PSURGE 30.2
20 mH current-compensated inductors for symmetrical signal-line testing.
The Haefely DEC 5 separates auxiliary equipment from an EUT during transient immunity testing on unshielded symmetrical lines. It supports up to four wires and impulses up to 6.6 kV, using 20 mh current-compensated inductors; two inductors with two coils each. Coupling is performed by a separate network, allowing protection and decoupling to match the signal circuit.
200 ohm resistors for symmetrical signal-line testing.
The Haefely DEC 6 separates auxiliary equipment from an EUT during transient immunity testing on unshielded symmetrical lines. It supports up to four wires and impulses up to 6.6 kV, using 200 ohm resistors. Coupling is performed by a separate network, allowing protection and decoupling to match the signal circuit.
The high-voltage impulse generator PG 6-364 generates standard impulse voltages with waveforms 1.2/50 µs and 10/700 µs. The Output voltage is adjustable between 0.2 kV and 6 kV. The polarity of the output voltage is selectable. Positive, negative or alternating polarity of the output voltage can be preselected. The generator is designed for dielectric testing of components and systems as well as testing of the electromagnetic compatibility of electronic systems and devices acc. to CCITT K17/K20/K22, ITU-T/K44, IEC 61000-4-5, VDE 0847.
HV - Impulse generators IPG 620, IPG 1050 and IPG 1272 create standard impulse voltages with waveform 1.2 / 50 µs acc. to IEC 60. The generators simulate surges caused by switching of inductive loads, power system switching, lightning strokes, etc. They are designed for testing of impulse dielectric strength of components, insulation, air-and surface flash-over gaps as well as for testing surge immunity of devices and systems acc. to CCITT - K22, ITU-T-K44. Picture: incl. option PA503
The high-voltage pulse generator PG 5-200/ 10-1000 creates standard impulse voltages with waveforms 1.2/50 µs and 10/700 µs. It is designed for dielectric testing of components and systems as well as testing of the electromagnetic compatibility of electronic systems and devices acc. to CCITT-K17/K20/K22, ITU-T/K44, IEC 61000-4-5 etc. They are designed for testing of impulse dielectric strength of components, insulation, air-and surface flash-over gaps as well as for testing surge immunity of devices and systems acc. to CCITT - K22, ITU-T-K44. Picture: incl. option PA503