Support arm with balancer for ESD test station

• The only support arm is made from non-metal 
• 1.5" Fiberglass Tubes,
• 3D Printed: Cage, holder, base
• Custom ESD simulator adaption
• Balancer is plastic housing and string (only the spring is metallic)
• Only the system meets the metal-free area requirements of standards
• Support arm with the carriage
• 360 degrees pivotable
• Customized attachment to the table included

150 kHz to 6 GHz | Internal spectrum analyzer | 1,218-probe array

EMScanner+ helps engineers locate and compare PCB emission sources across a 316 x 218 mm scan area. A fixed array of 1,218 magnetic-field probes gives fast coverage, with 7.5 mm physical spacing and a manufacturer-stated 3.75 mm effective resolution. The internal spectrum analyzer simplifies the measurement setup; a user PC runs EMViewer.

Audio Transformer 200W, 50A

• 160x155x200mm
• 2:1 ratio 
• 200 W Maximum30Hz - 250 kHz
• 100 W Maximum at15 Hz - 30 Hz
• Insulation Resistance Test - 2kV

150 kHz to 6 GHz | Internal spectrum analyzer | Down to 0.06 mm

EMScannerR+ helps engineers locate and compare PCB emission sources across a 316 x 218 mm scan area. Its eight selectable resolution levels run from 7.5 mm down to 0.06 mm for detailed investigation of dense boards. The internal spectrum analyzer simplifies the measurement setup; a user PC runs EMViewer.

5 E/H-field probes | Camera tracking | Live EMI visualization

NFP Kit adds camera-based position tracking to handheld near-field measurements. EMViewer recognizes the probe and measurement location from visible markers, helping engineers map emission sources while moving the probe by hand. The kit combines five electric/magnetic probes, a camera, mounting arm and measurement software with your compatible spectrum analyzer.

Component-side scanning | Adjustable probe height | External analyzer

EMProbe automates a handheld near-field probe over the component side of a PCB or around a non-flat assembly. Program scan height and position in EMViewer, then acquire RF measurements with a compatible external spectrum analyzer. The compact arm is suited to repeatable bench investigations, with larger arm or extension configurations available for application-specific work.