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Langer EMV-Technik | PCB and IC EMC Test Equipment

Langer EMV-Technik | PCB and IC EMC Test Equipment 

Langer EMV-Technik develops tools for finding electromagnetic interference (EMI) at the circuit board and integrated circuit level. Engineers use Langer’s near-field probes, disturbance injection tools and scanning systems to locate emissions, reproduce immunity failures and evaluate design changes before formal EMC testing.

Start with the problem you need to solve. Use near-field probes to locate emissions. Use localized disturbance injection to find where interference enters the circuit. Use a positioning system when you need to compare measurements at the same points across boards or design revisions.

Near-field probes for PCB emissions troubleshooting

Use an H-field probe to investigate magnetic fields near current loops, traces, inductors and IC pins. Use an E-field probe to investigate electric fields near switching nodes, conductors and other voltage-driven sources. Start with a larger probe head to survey the assembly, then move to a smaller head to pinpoint the source.

Langer near-field probe families
FamilyPublished family rangeTypical use
LF 100 kHz to 50 MHz Passive magnetic-field probes for lower-frequency sources such as switching converters and power circuits.
RF 30 MHz to 3 GHz Passive E-field and H-field probes for general PCB diagnostics. The RF Basic set includes six probes for surveying a board and narrowing down the source.
XF 30 MHz to 6 GHz Passive probes for emissions work above 3 GHz. The XF1 set includes four magnetic-field probes and one electric-field probe.
SX 1 GHz to 20 GHz Passive probes for higher-frequency emissions near RF circuitry and high-speed interconnects.
HR Up to 40 GHz Passive probes for higher-frequency investigations. Check the usable band of the specific probe.
MFA 1 MHz to 6 GHz Active microprobes for localized measurements around small components and dense layouts.

Individual probes vary in frequency response, sensitivity and spatial resolution. Match the probe and cable to the frequency of interest and the input of your spectrum analyzer, EMI receiver or oscilloscope. View Langer’s near-field probe catalog

PCB immunity and transient troubleshooting

Apply a disturbance to a selected area of a powered assembly while monitoring its response. Mini burst field generators and the E1 immunity development system help identify sensitive traces, interfaces and components. Repeat the test after changes to grounding, routing, filtering or shielding to see which change improved immunity. Langer also offers accessories for EFT/burst setups and optical links for signal monitoring. Explore Langer PCB immunity tools

Integrated circuit emissions, immunity and security

Langer’s IC test system supports measurements on operating devices. Depending on the fixture and probe, engineers can investigate emissions at IC pins or around the package, apply localized electric or magnetic fields, or inject conducted disturbances into selected pins. The IC security range includes tools for electromagnetic side-channel analysis and electromagnetic fault injection. View the Langer product catalog · Explore IC security tools

Automated scanning, software and lab equipment

Langer positioning systems move compatible probes through defined scan paths to help reproduce measurements and compare emissions maps. The broader range includes ChipScan software, measurement and calibration stations, and demonstration boards for hands-on EMC training. Explore Langer positioning systems

Discuss your test setup with Absolute EMC. Share the frequency range, the area you need to probe, and your existing instruments. For immunity troubleshooting, include the disturbance type and the failure you’re trying to reproduce. Contact Absolute EMC

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