Langer Handheld Near-Field Probes

37 Langer handheld near-field probes | Passive electric and magnetic probes | Active MFA microprobes

Compare frequency coverage, probe size and orientation to locate EMI on PCB traces, IC pins, cables and microwave assemblies. Select a standalone probe or follow the kit links for complete sets and their individual options.

Select Options/Sizes:

Langer XF-E 09s Datasheet

Langer LF-R 3 Datasheet

Langer LF-K 7 Datasheet

Langer XF E 04s Datasheet

Langer XF R 100-1 Datasheet

SPECIFICATIONS

Langer handheld near-field probe selection guide

Start with a larger probe to survey the assembly, then use a smaller tip to pinpoint the source. Rotate magnetic loops to compare pickup. For electric-field measurements, aim the sensing face toward the source and keep the spacing consistent.

PhotoProbeFrequency rangeField / typeSize / resolutionUse and orientationAvailable in these sets
LF-B 3 near-field probe LF-B 3 100 kHz to 50 MHz H / passive dia. approx. 4 mm
Resolution approx. 2 mm
Hold the shaft upright so the angled coil can reach between components. LF1 set
LF-K 7 near-field probe LF-K 7 100 kHz to 50 MHz H / passive approx. (6 x 10) mm
Resolution approx. 5 mm
Use the paired coils near conductors, connectors or edges where the field wraps around the structure. Individual probe
LF-R 3 near-field probe LF-R 3 100 kHz to 50 MHz H / passive dia. approx. 3 mm
Resolution approx. 1 mm
Bring the small loop close to traces, decoupling components and IC pins. Individual probe
LF-R 400 near-field probe LF-R 400 100 kHz to 50 MHz H / passive dia. 25 mm Survey the assembly with the large loop. Rotate it to maximize magnetic pickup. LF1 set
LF-R 50 near-field probe LF-R 50 100 kHz to 50 MHz H / passive dia. approx. 10 mm Survey nearby assemblies and cables before using a finer loop. Individual probe
LF-U 2.5 near-field probe LF-U 2.5 100 kHz to 50 MHz H / passive dia. approx. 4 mm
Resolution approx. 0.5 mm
Place the narrow active gap over a trace or IC pin. LF1 set
LF-U 5 near-field probe LF-U 5 100 kHz to 50 MHz H / passive approx. (6 x 6) mm
Resolution approx. 5 mm
Position the wider U-shaped opening over broad traces, cables and connectors. LF1 set
RF-B 0.3-3 near-field probe RF-B 0.3-3 30 MHz to 3 GHz H / passive dia. approx. 2 mm
Resolution < 1 mm
Use the angled coil with the shaft upright for close access between PCB components. RF3 mini set
RF-B 3-2 near-field probe RF-B 3-2 30 MHz to 3 GHz H / passive dia. approx. 4 mm
Resolution approx. 2 mm
Use the angled coil with the shaft upright for close access between PCB components. RF Basic set
RF2 set
RF-E 02 near-field probe RF-E 02 30 MHz to 1.5 GHz E / passive approx. (23 x 53) mm Face the broad underside electrode toward a bus or supply surface, typically at 1 to 2 cm. RF Basic set
RF4-E set
RF-E 05 near-field probe RF-E 05 30 MHz to 3 GHz E / passive approx. (1 x 8) mm
Resolution approx. 0.6 mm
Aim the fine underside electrode at clock traces or pins. Also suited to scanner use. RF Basic set
RF4-E set
RF-E 10 near-field probe RF-E 10 30 MHz to 3 GHz E / passive approx. (0.5 x 2) mm
Resolution approx. 0.2 mm
Aim the narrow lower edge at individual pins or fine traces. RF1 set
RF-K 7-4 near-field probe RF-K 7-4 30 MHz to 1 GHz H / passive approx. (6 x 10) mm
Resolution approx. 5 mm
Use the paired coils where the field wraps around a conductor, connector or edge. RF1 set
RF-R 0.3-3 near-field probe RF-R 0.3-3 30 MHz to 3 GHz H / passive dia. approx. 2 mm
Resolution < 1 mm
Use the miniature loop for sub-millimeter localization at small traces and pins. RF3 mini set
RF-R 3-2 near-field probe RF-R 3-2 30 MHz to 3 GHz H / passive dia. approx. 3 mm
Resolution approx. 1 mm
Bring the fine loop close to traces, IC pins or small components. Rotate to check field direction. RF Basic set
RF1 set
RF-R 400-1 near-field probe RF-R 400-1 30 MHz to 3 GHz H / passive dia. approx. 25 mm Survey a broad area with the large loop before moving to a finer probe. RF Basic set
RF2 set
RF-R 50-1 near-field probe RF-R 50-1 30 MHz to 3 GHz H / passive dia. approx. 10 mm Use the mid-size loop for closer surveys of assemblies or cables. RF2 set
RF-U 2.5-2 near-field probe RF-U 2.5-2 30 MHz to 3 GHz H / passive dia. approx. 4 mm
Resolution approx. 0.5 mm
Align the narrow active gap over a trace or pin for selective RF current pickup. RF Basic set
RF1 set
RF-U 5-2 near-field probe RF-U 5-2 30 MHz to 3 GHz H / passive approx. (6 x 6) mm
Resolution approx. 5 mm
Use the wider opening over broad conductors, cables or connectors. RF2 set
XF-B 3-1 near-field probe XF-B 3-1 30 MHz to 6 GHz H / passive dia. approx. 4 mm
Resolution approx. 2 mm
Use the angled coil with the shaft upright for close access between PCB components. XF1 set
XF-E 04s near-field probe XF-E 04s 30 MHz to 6 GHz E / passive approx. (5 x 5) mm Face the small electrode toward the IC or trace at 0.5 to 10 mm. Individual probe
XF-E 09s near-field probe XF-E 09s 30 MHz to 6 GHz E / passive approx. (10 x 10) mm Face the larger electrode toward the IC at 0.5 to 10 mm. Individual probe
XF-E 10 near-field probe XF-E 10 30 MHz to 6 GHz E / passive approx. (0.5 x 2) mm
Resolution approx. 0.2 mm
Align the narrow electrode with a trace or pin for fine E-field localization. XF1 set
XF-R 100-1 near-field probe XF-R 100-1 30 MHz to 6 GHz H / passive approx. (10x10) mm
Resolution dia. approx. 10 mm
Use the mid-size head for localized magnetic surveys. Rotate to find the strongest coupling. Individual probe
XF-R 3-1 near-field probe XF-R 3-1 30 MHz to 6 GHz H / passive dia. approx. 3 mm
Resolution approx. 1 mm
Bring the fine loop close to traces, IC pins or small components. Rotate to check field direction. XF1 set
XF-R 400-1 near-field probe XF-R 400-1 30 MHz to 6 GHz H / passive dia. approx. 25 mm Survey a broad area with the large loop before moving to a finer probe. XF1 set
XF-U 2.5-1 near-field probe XF-U 2.5-1 30 MHz to 6 GHz H / passive dia. approx. 4 mm
Resolution approx. 0.5 mm
Align the narrow active gap over a trace or pin for selective RF current pickup. XF1 set
SX-B 3-1 near-field probe SX-B 3-1 1 GHz to 10 GHz H / passive dia. approx. 4 mm
Resolution approx. 2 mm
Use the angled coil with the shaft upright for close access between PCB components. SX1 set
SX-E 03 near-field probe SX-E 03 1 GHz to 10 GHz E / passive approx. (4 x 4) mm Aim the underside electrode toward the trace or component. SX1 set
SX-R 20-1 near-field probe SX-R 20-1 1 GHz to 20 GHz H / passive approx. 6x6 mm Bring the compact magnetic head close to microwave traces or ICs and rotate to compare coupling. SX-R 20-1 set
SX-R 3-1 near-field probe SX-R 3-1 1 GHz to 10 GHz H / passive dia. approx. 3 mm
Resolution approx. 1 mm
Bring the fine loop close to traces, IC pins or small components. Rotate to check field direction. SX1 set
HR-E 40-1 near-field probe HR-E 40-1 Up to 40 GHz E / passive 0.25 mm electrode diameter
Resolution 0.2 mm
Aim the small electrode toward the microwave trace. Keep standoff consistent. HR1 set
HR-E 40-1 set
HR-R 8-1 near-field probe HR-R 8-1 Up to 40 GHz H / passive 4 x 4 x 1 mm head Bring the magnetic tip close to microwave traces or packages. Internal matching is 50 ohm. HR1 set
HR-R 8-1 set
MFA-K 0.1-12 near-field probe MFA-K 0.1-12 100 MHz to 6 GHz H / active Resolution 200 um Center the shielded head over the conductor for selective RF current pickup. Power through the BT 706 bias tee. MFA 01 set
MFA-K 0.1-30 near-field probe MFA-K 0.1-30 1 MHz to 1 GHz H / active Resolution 200 um Center the shielded head over the conductor for selective RF current pickup. Power through the BT 706 bias tee. MFA 02 set
MFA-R 0.2-6 near-field probe MFA-R 0.2-6 100 MHz to 6 GHz H / active Resolution 300 um Place the active miniature head near pins or SMD components and rotate to compare magnetic pickup. Use the BT 706 bias tee. MFA 01 set
MFA-R 0.2-75 near-field probe MFA-R 0.2-75 1 MHz to 1 GHz H / active Resolution 300 um Place the active miniature head near pins or SMD components and rotate to compare magnetic pickup. Use the BT 706 bias tee. MFA 01 set
MFA 02 set


Measurement setup

Use a suitable spectrum analyzer or oscilloscope with a 50 ohm input and cables rated for the measurement frequency. Active MFA probes require the BT 706 bias tee and a suitable power supply. Physical tip size and spatial resolution are listed separately where Langer specifies both.

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