• Langer LF1 Set | 100 kHz to 50 MHz Near-Field Probes
  • Langer LF1 Set | 100 kHz to 50 MHz Near-Field Probes
  • Langer LF1 Set | 100 kHz to 50 MHz Near-Field Probes
  • Langer LF1 Set | 100 kHz to 50 MHz Near-Field Probes
  • Langer LF1 Set | 100 kHz to 50 MHz Near-Field Probes
  • Langer LF1 Set | 100 kHz to 50 MHz Near-Field Probes
  • Langer LF1 Set | 100 kHz to 50 MHz Near-Field Probes

Langer LF1 Set | 100 kHz to 50 MHz Near-Field Probes

100 kHz to 50 MHz | 4 shielded passive H-field probes | SMB output

Find magnetic emissions from switching power stages, cables and individual IC connections. Start with the LF-R 400 to survey the assembly, then move to the smaller heads to isolate the source.

PARTNER:

MARKETS:

CATEGORIES:

TEST STANDARDS:

Select Options/Sizes:

Langer LF1 Set Datasheet

Langer LF-R 400 Datasheet

Langer LF-B 3 Datasheet

Langer LF-U 2.5 Datasheet

Langer LF-U 5 Datasheet

SPECIFICATIONS

LF1 near-field probe set

Find magnetic emissions from switching power stages, cables and individual IC connections. Start with the LF-R 400 to survey the assembly, then move to the smaller heads to isolate the source.


Technical specifications

ParameterSpecification
Set frequency coverage 100 kHz to 50 MHz
Probe configuration 4 shielded passive H-field probes
Probe output SMB
Published set weight 200 g
Published dimensions 17.5 x 14 x 3.5 cm


Included components

PhotoModel / itemQty.Frequency rangeFunction
LF-R 400 LF-R 400 1 100 kHz to 50 MHz Large 25 mm loop for surveying at distances up to 10 cm
LF-B 3 LF-B 3 1 100 kHz to 50 MHz Angled head for access between components
LF-U 2.5 LF-U 2.5 1 100 kHz to 50 MHz Narrow gap for traces and IC pins
LF-U 5 LF-U 5 1 100 kHz to 50 MHz Larger opening for wider traces, cables and connectors
SMB-BNC 1 m shown in the kit
Kit view		 SMB-BNC 1 m 1   Included accessory
Case 4+ shown with the kit
Kit view		 Case 4+ 1   Included accessory


Measurement setup

Connect to a suitable spectrum analyzer or oscilloscope with a 50 ohm input. Keep probe orientation, distance and instrument settings consistent when comparing design revisions. Near-field readings help locate sources and coupling paths during EMC development.


Near-field probe techniques from Langer

Langer demonstrates probe tip shapes, correction curves and time-domain measurements. The tutorial covers general probe technique.

Watch the Langer near-field probe tutorial on YouTube


Near-field probe kit selection guide

PhotoKitProbes includedFrequency coverageChoose it for
Y.I.C. NFP Kit Y.I.C. NFP Kit 5 10 MHz to 14 GHz Handheld EMI mapping with five E-field and H-field probes, camera tracking and EMViewer. Uses a compatible external spectrum analyzer.
LF1 kit LF1 set (this set) 4 100 kHz to 50 MHz Lower-frequency magnetic fields near power circuits
RF Basic kit RF Basic set 6 30 MHz to 3 GHz General PCB survey and fine electric and magnetic troubleshooting
RF1 kit RF1 set 4 30 MHz to 3 GHz Close-range electric and magnetic troubleshooting
RF2 kit RF2 set 4 30 MHz to 3 GHz Magnetic survey and source tracing with four heads
RF3 mini kit RF3 mini set 2 30 MHz to 3 GHz Sub-millimeter magnetic source localization
RF4-E kit RF4-E set 2 30 MHz to 3 GHz Electric-field coupling and switching-node investigations
XF1 kit XF1 set 5 30 MHz to 6 GHz Electric and magnetic PCB diagnostics through 6 GHz
SX1 kit SX1 set 3 1 GHz to 10 GHz Electric and magnetic diagnostics from 1 to 10 GHz
SX-R 20-1 kit SX-R 20-1 set 1 1 GHz to 20 GHz Single magnetic probe for measurements through 20 GHz
HR1 kit HR1 set 2 Up to 40 GHz Combined electric and magnetic coverage through 40 GHz
HR-E 40-1 kit HR-E 40-1 set 1 Up to 40 GHz Single electric-field probe for measurements up to 40 GHz (0.2 mm)
HR-R 8-1 kit HR-R 8-1 set 1 Up to 40 GHz Single magnetic-field probe for measurements up to 40 GHz
MFA 01 kit MFA 01 set 3 1 MHz to 6 GHz Handheld active magnetic microprobes (200 μm)
MFA 02 kit MFA 02 set 2 1 MHz to 1 GHz Handheld active magnetic microprobes (200 μm)
OTHER PRODUCTS IN THE SAME CATEGORY:
Loading...