Langer ICR E150 Set | 7 MHz to 3 GHz Near-Field Probes
7 MHz to 3 GHz | Scanner-mounted E-field mapping around ICs (65 μm)
Map localized electric fields around an operating IC. The 150 x 35 um electrode and published 65 um resolution support close surface and pin scans. Use a compatible scanner and the included bias tee and correction data.
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Langer ICR E150 Set Datasheet
SPECIFICATIONS
ICR E150 near-field probe set
Map localized electric fields around an operating IC. The 150 x 35 um electrode and published 65 um resolution support close surface and pin scans. Use a compatible scanner and the included bias tee and correction data.
Technical specifications
| Parameter | Specification |
|---|---|
| Frequency coverage | 7 MHz to 3 GHz |
| Spatial resolution | 65 μm |
| Electrode dimensions | (150 x 35) μm |
Included components
| Photo | Model / item | Qty. | Function |
|---|---|---|---|
 |
ICR E150 | 1 | Near-Field Microprobe E-field 7 MHz to 3 GHz |
 |
BT 706 | 1 | Bias Tee for Langer probes |
 |
SMA-SMA RA | 1 | Cable SMA-SMA, right angle |
 Sample certificate |
ICR-C | 1 | ICR Certificate |
| ICR Corr | 1 | Correction Curves ICR / USB | |
 |
NT FRI EU | 1 | Power Supply Unit |
 Kit view |
ICR case1 | 1 | System Case |
Compare ICR microprobe sets
See the Langer ICR microprobe selection guide for coil orientation, frequency coverage and spatial resolution across the family.
Near-field probe techniques from Langer
Langer demonstrates probe tip shapes, correction curves and time-domain measurements. The tutorial covers general probe technique.
OTHER PRODUCTS IN THE SAME CATEGORY:
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EMScanner+: 150 kHz- 6 GHz, w/ Real-Time Spectrum Analyzer, EMC desktop scanner
EMScannerR+: 150 kHz- 6 GHz, w/ Real-Time Spectrum Analyzer, EMC desktop scanner
NFPKIT, EM Near Field Probe Kit w/Camera & Software
EMProbe: 9kHz- 18 GHz, 0.2mm resolution, EMC robotic scanner
EMScannerR: 150 kHz- 8 GHz, 0.06mm resolution, EMC desktop scanner
EMScanner: 150 kHz- 8 GHz, 3.5mm Resolution, EMC desktop scanner
Langer ICR Near-Field Microprobe Selection Guide
Langer Handheld Near-Field Probes Selection Guide
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