Langer XF1 Set | 30 MHz to 6 GHz Near-Field Probes

30 MHz to 6 GHz | 4 passive H-field probes and 1 passive E-field probe | SMA output

Survey emissions through 6 GHz and narrow down coupling paths with dedicated probe shapes. The XF probes include internal termination and impedance matching. Langer reports lower sensitivity at the low end than its RF-series probes.

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LANGER EMV-TECHNIK | PCB AND IC EMC TEST EQUIPMENT

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Langer XF1 Set Datasheet

Langer XF-R 400-1 Datasheet

Langer XF-R 3-1 Datasheet

Langer XF-B 3-1 Datasheet

Langer XF-E 10 Datasheet

Langer XF-U 2.5-1 Datasheet

SPECIFICATIONS

XF1 near-field probe set

Technical specifications

Parameter	Specification
Set frequency coverage	30 MHz to 6 GHz
Probe configuration	4 passive H-field probes and 1 passive E-field probe
Probe output	SMA
Published set weight	400 g
Published dimensions	24 x 19.5 x 6 cm

Included components

Photo	Model / item	Qty.	Frequency range	Function
	XF-R 400-1	1	30 MHz to 6 GHz	Large H-field survey loop
	XF-R 3-1	1	30 MHz to 6 GHz	Fine H-field probe for PCB traces and ICs
	XF-B 3-1	1	30 MHz to 6 GHz	Angled H-field probe for confined areas
	XF-E 10	1	30 MHz to 6 GHz	E-field probe for localized sources
	XF-U 2.5-1	1	30 MHz to 6 GHz	Narrow-gap H-field probe for conductors
Kit view	SMA-SMA 1 m	1		Included accessory
-	XF 1 qg - Quick guide	1		Included accessory
Kit view	Case 5	1		Included accessory

Measurement setup

Connect to a suitable spectrum analyzer or oscilloscope with a 50 ohm input. Keep probe orientation, distance and instrument settings consistent when comparing design revisions. Near-field readings help locate sources and coupling paths during EMC development.

Near-field probe techniques from Langer

Langer demonstrates probe tip shapes, correction curves and time-domain measurements. The tutorial covers general probe technique.

Watch the Langer near-field probe tutorial on YouTube

Near-field probe kit selection guide

Kit	Probes included	Frequency coverage	Choose it for
Y.I.C. NFP Kit	5	10 MHz to 14 GHz	Handheld EMI mapping with five E-field and H-field probes, camera tracking and EMViewer. Uses a compatible external spectrum analyzer.
LF1 set	4	100 kHz to 50 MHz	Lower-frequency magnetic fields near power circuits
RF Basic set	6	30 MHz to 3 GHz	General PCB survey and fine electric and magnetic troubleshooting
RF1 set	4	30 MHz to 3 GHz	Close-range electric and magnetic troubleshooting
RF2 set	4	30 MHz to 3 GHz	Magnetic survey and source tracing with four heads
RF3 mini set	2	30 MHz to 3 GHz	Sub-millimeter magnetic source localization
RF4-E set	2	30 MHz to 3 GHz	Electric-field coupling and switching-node investigations
XF1 set (this set)	5	30 MHz to 6 GHz	Electric and magnetic PCB diagnostics through 6 GHz
SX1 set	3	1 GHz to 10 GHz	Electric and magnetic diagnostics from 1 to 10 GHz
SX-R 20-1 set	1	1 GHz to 20 GHz	Single magnetic probe for measurements through 20 GHz
HR1 set	2	Up to 40 GHz	Combined electric and magnetic coverage through 40 GHz
HR-E 40-1 set	1	Up to 40 GHz	Single electric-field probe for measurements up to 40 GHz (0.2 mm)
HR-R 8-1 set	1	Up to 40 GHz	Single magnetic-field probe for measurements up to 40 GHz
MFA 01 set	3	1 MHz to 6 GHz	Handheld active magnetic microprobes (200 μm)
MFA 02 set	2	1 MHz to 1 GHz	Handheld active magnetic microprobes (200 μm)