• EMScanner: 150 kHz- 8 GHz, 3.5mm Resolution, EMC desktop scanner
  • EMScanner: 150 kHz- 8 GHz, 3.5mm Resolution, EMC desktop scanner
  • EMScanner: 150 kHz- 8 GHz, 3.5mm Resolution, EMC desktop scanner
  • EMScanner: 150 kHz- 8 GHz, 3.5mm Resolution, EMC desktop scanner

EMScanner: 150 kHz- 8 GHz, 3.5mm Resolution, EMC desktop scanner

150 kHz to 8 GHz | External spectrum analyzer | 1,218-probe array

EMScanner helps engineers locate and compare PCB emission sources across a 316 x 218 mm scan area. A fixed array of 1,218 magnetic-field probes gives fast coverage, with 7.5 mm physical spacing and a manufacturer-stated 3.75 mm effective resolution. Use it with a compatible external spectrum analyzer and a PC running EMViewer.

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Data Sheet

Setup Guide

SPECIFICATIONS

EMScanner - 8 GHz Near-Field EMI Scanner

150 kHz to 8 GHz | External spectrum analyzer | 1,218-probe array

EMScanner near-field EMC and EMI diagnostic system

Application and capabilities

EMScanner helps engineers locate and compare PCB emission sources across a 316 x 218 mm scan area. A fixed array of 1,218 magnetic-field probes gives fast coverage, with 7.5 mm physical spacing and a manufacturer-stated 3.75 mm effective resolution. Use it with a compatible external spectrum analyzer and a PC running EMViewer.

  • Locate emission hot spots, current paths, RF leakage and intermittent sources on operating PCBs.
  • Compare design revisions, filter changes and shielding modifications using repeatable scan settings.
  • Use spectral, spatial and combined scanning in EMViewer; retain peak-hold results and compare scans.
  • Support scripting, limit lines and reports for engineering investigations.

Technical specifications

SpecificationDetails
Frequency coverage 150 kHz to 8 GHz
Spectrum analyzer External, compatible
Spatial sampling / resolution 7.5 mm pitch; 3.75 mm effective
Antenna array 1,218 H-field probes arranged as 42 x 29
Scan area 316 x 218 mm (12.44 x 8.58 in)
Probe-to-probe correction Factory calibration; frequency-dependent correction factors, +/-3 dB
Measurement-plane isolation Greater than 20 dB
Maximum radiated power load 10 W / 40 dBm, as specified for the scanner
Enclosure Anodized non-conductive metal
Dielectric withstand: glass cover 4 kV DC; 2.6 kV AC
Dielectric withstand: metal case 260 V DC; 200 V AC
Operating temperature 15 to 40 degrees C; datasheet condition: continuous spectral/spatial scanning at 50 MHz
Measurement sensitivity Determined by analyzer performance and measurement settings
Frequency marking accuracy Determined by spectrum analyzer
Full-area spatial scan Continuous or sub-second single scan; dependent on analyzer and settings
Spectral scan example 45 s for a 100 x 100 mm area, 100 MHz span and 100 kHz RBW
Operating system Windows 10/11 in the retained setup guide/datasheet; verify the installed EMViewer release
Overlays Gerber RS274x and HPGL
Dimensions (L x W x H) 392 x 244 x 17 mm (15.43 x 9.61 x 0.67 in)
Weight 2.80 kg / 6.17 lb including cables and adapter
In-situ use 6U Size C format for VXI/VME chassis
RF connection SMA-to-Type-N RF cable
Control connection USB to adapter; dedicated control cable to scanner
Automation Public API for C or Python, described in retained datasheet

System components

Documented system components

  • EMS08 scanner board
  • EMScanner adapter
  • Micro-D control cable
  • USB cable with ferrites, per setup guide

User-supplied or separately specified

  • PC running the supported EMViewer release
  • DUT power, fixtures and appropriate RF/control connections
  • Compatible external spectrum analyzer; confirm driver support and required RF bandwidth

Measurement workflow

StepWhat the engineer does
1. Configure Choose the frequency band, analyzer settings and scan area; connect the DUT and measurement system.
2. Locate Run a spectral or spatial scan to identify frequencies and emission hot spots.
3. Investigate Refine the region, probe position or resolution while keeping the setup controlled.
4. Compare Repeat after a design change, compare results and retain maps and reports.

Software and configuration

EMViewer links scan position with RF measurements. Available modes include spectral sweeps, spatial hot-spot maps and combined scans. Confirm the supported software release, analyzer driver, license and support term when configuring the system.

EMViewer software information | Spectrum-analyzer compatibility

Scan times are examples tied to scan area, frequency span, RBW and resolution; the finest resolution is not a full-area real-time scan.

Dielectric-withstand values are test ratings, not a blanket safe operating-voltage rating for an energized DUT.

Datasheets and setup resources

Manufacturer product information

Compare Y.I.C. near-field scanning solutions

Choose the measurement method, analyzer configuration and workspace that fit your DUT. Select a product name or picture for its full details.

ProductMethod / best fitRF coverage / analyzerScan area or workspaceSampling / positioning
EMScanner near-field EMC and EMI diagnostic system
EMScanner		 Fixed H-field array

Fast PCB overview and design comparisons		 150 kHz to 8 GHz

External, compatible		 316 x 218 mm 7.5 mm pitch; 3.75 mm effective
EMScannerR near-field EMC and EMI diagnostic system
EMScannerR		 High-resolution array

Dense PCB hot-spot detail		 150 kHz to 8 GHz

External, compatible		 316 x 218 mm 7.5 to 0.06 mm; 8 levels
EMScanner+ near-field EMC and EMI diagnostic system
EMScanner+		 Fixed H-field array

Fast PCB overview and design comparisons		 150 kHz to 6 GHz

Internal BB60C		 316 x 218 mm 7.5 mm pitch; 3.75 mm effective
EMScannerR+ near-field EMC and EMI diagnostic system
EMScannerR+		 High-resolution array

Dense PCB hot-spot detail		 150 kHz to 6 GHz

Internal BB60C		 316 x 218 mm 7.5 to 0.06 mm; 8 levels
NFP Kit near-field EMC and EMI diagnostic system
NFP Kit		 Handheld, camera-tracked

Interactive troubleshooting and flexible probing		 Probe/analyzer dependent; see probe table

External, compatible		 Camera field of view / setup Manual positioning; tracking/setup dependent
EMProbe near-field EMC and EMI diagnostic system
EMProbe		 Compact robotic arm

Component-side and variable-height scans		 Probe/analyzer dependent; see probe table

External, compatible		 300 mm radius, standard arm 7.5 to 0.2 mm scan spacing
EMProbe DBM E6 near-field EMC and EMI diagnostic system
EMProbe DBM E6		 6-axis robot

Repeatable multi-angle scans		 Probe/analyzer dependent; see probe table

External, compatible		 450 mm radius 0.1 mm scan spacing; 0.01 mm repeatability
EMProbe CR5 near-field EMC and EMI diagnostic system
EMProbe CR5		 Custom 6-axis robot

Larger DUTs and custom fixtures		 Selected probes and analyzer

External, compatible		 900 mm working-radius example; usable scan envelope customized +/-0.02 mm robot repeatability; scan spacing specified per project
Array spacing, effective resolution, robotic scan spacing and robot repeatability describe different properties. Probe systems do not have one continuous guaranteed frequency range independent of the selected probe and analyzer. CR5 values are a project example; final specifications are defined by quotation. Near-field diagnostics support EMC development and do not replace a formal emissions compliance test.
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