The capacitive Coupling-/Decoupling Network CDN 5404 is used in combination with the IPG2554 and allows superimposition of damped oscillatory wave up to four I/O signal lines. For eight data lines, two devices can be used.
Designed for applying the impulse output voltage of the Combination Wave Generator to interconnection lines of the equipment under test, acc. to IEC 61000-4-5, Fig10.
The capacitive Coupling-/Decoupling Networks CDN 5416/7416/10416/12416 are used in combination with the Multi-CE5 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.
The capacitive Coupling-/Decoupling Network CDN 10216 & 12216 is used in combination with the Surge generators PG 7-250, PG 10-504 or PG 12-804 and allows superimposition of surge test pulses to the single-phase power supply voltage of the device under test. The test set-up is suitable for immunity testing of electronic systems and devices according to IEC 61000-4-4, IEC 61000-4-5 and IEEE 587.
The capacitive Coupling-/Decoupling Networks CDN 54200/ 74200/ 104200/ 12420 are used in combination with the Multi-CE5 / Multi-CE7 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.
The capacitive Coupling-/Decoupling Networks CDN 54125 / 74125 / 104125 / 124125 are used in combination with the Multi-CE5 / Multi-CE7 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.
The capacitive Coupling-/Decoupling Networks CDN 5432/7432/10432/12432 are used in combination with the Multi-CE5 / Multi-CE7 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.
The capacitive Coupling-/Decoupling Networks CDN 2402/2410 are used in combination with the Multi-CE5 and allows superimposition of surge and burst test pulses to up to four I/O signal lines. The test set-up is suitable for surge immunity testing of electronic systems and devices according to IEC 61000-4-4, IEC 61000-4-5 and IEEE 587.
The capacitive Coupling-/Decoupling Network CDN 2802 is used in combination with the Multi-CE5 & Multi-CE7 and allows superimposition of surge and burst test pulses to up to eight I/O signal lines.
The Capacitive Coupling Clamp, EFTC 2012, provides the ability to couple Burst / EFT pulses to data lines. It can also be used for coupling to main lines where no CDN is available, for example, high current lines >200 A.
IEC / EN 61000-4-2 The test generator SESD 216 simulates electrostatic discharge as defined in the standard IEC / EN 61000-4-2. Depend on the Equipment Under Test (EUT) and the test set-up for laboratory tests the IEC standard shows two test methods; Air discharge (AIR) and Contact discharge (CON); Test voltage max. 16,5 kV AIR, max. 10,0 kV CON; Discharge impedance 150pF/330 Ohm (IEC); Battery or mains operation; Predefined tests - standard and other