Axos 5 - Compact
Axos 8 - Compact
PEFT 8010
PSURGE 30.2
FP-COMB 63/690-1
FP-COMB 32
The ESD Test Table Kit is a simple inexpensive solution for your ESD testing. Complies to the requirements of IEC 61000-4-2 and can be used for additional standards. Comes with a Horizontal Coupling Plane (HCP), resistive cable to tie HCP to floor ground plane, bleeder wire for discharging ungrounded battery powered EUTs, 0.05mm insulator and an alternative low impedance ground for using the table for additional setups such as IEC 61000-4-6 requirements.
The EFTC-CK is a calibration kit for burst/EFT coupling clamps as specified in IEC 6100-4-4:2012. It has been designed for calibration of coupling clamps like EFTC2012. The set consists of a transducer plate and a termination bracket (connecting adapter).
The Electrical Fast Transient Generator EFTG-CE5 is a compact EMC test unit for testing electromagnetic immunity against electrical fast transients. The generator provides burst-pulses, which are adjustable in frequency, amplitude, duration and repetition rate. It is suitable to test the susceptibility levels of electrical systems and installations full compliant to IEC 61000-4-4.
The Burst Calibration Kit has been designed to measure the pulse output voltage and the pulse output current of burst generators, e.g. the EFTG-CE5 or the burst generator sub-unit of the Multi-CE5. It essentially consists of a load resistor, a pulse voltage divider, and a double-shielded coaxial cable. ? Burst Calibration Kit ? Input voltage: 5 kV ? Ratio, 200/400:1 ? Bandwidth: 400 MHz
The Capacitive Coupling Clamp, EFTC 2012, provides the ability to couple Burst / EFT pulses to data lines. It can also be used for coupling to main lines where no CDN is available, for example, high current lines >200 A.
The capacitive Coupling-/Decoupling Networks CDN 5416/7416/10416/12416 are used in combination with the Multi-CE5 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.