Axos 5 - Compact
Axos 8 - Compact
PEFT 8010
PSURGE 30.2
FP-COMB 63/690-1
FP-COMB 32
The ESD Test Table Kit is a simple inexpensive solution for your ESD testing. Complies to the requirements of IEC 61000-4-2 and can be used for additional standards. Comes with a Horizontal Coupling Plane (HCP), resistive cable to tie HCP to floor ground plane, bleeder wire for discharging ungrounded battery powered EUTs, 0.05mm insulator and an alternative low impedance ground for using the table for additional setups such as IEC 61000-4-6 requirements.
The capacitive Coupling-/Decoupling Networks CDN 5416/7416/10416/12416 are used in combination with the Multi-CE5 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.
The capacitive Coupling-/Decoupling Network CDN 10216 & 12216 is used in combination with the Surge generators PG 7-250, PG 10-504 or PG 12-804 and allows superimposition of surge test pulses to the single-phase power supply voltage of the device under test. The test set-up is suitable for immunity testing of electronic systems and devices according to IEC 61000-4-4, IEC 61000-4-5 and IEEE 587.
The capacitive Coupling-/Decoupling Networks CDN 5432/7432/10432/12432 are used in combination with the Multi-CE5 / Multi-CE7 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.
The capacitive Coupling-/Decoupling Networks CDN 5463/7463/10463/12463 are used in combination with the Multi-CE5 / Multi-CE7 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.
The capacitive Coupling-/Decoupling Networks CDN 54125 / 74125 / 104125 / 124125 are used in combination with the Multi-CE5 / Multi-CE7 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.