The TBPS01 EMC near field probes H20, H10, H5 and E5 are magnetic field (H) and electric field (E) probes for radiated emissions EMC pre-compliance measurements. The probes are used in the near field of sources of electromagnetic radiation.
They serve to locate and identify potential sources of interference within the building blocks of electronic assemblies.
The probes act similar as wide bandwidth antennas, picking up radiated emissions from components, PCB traces, housing openings or gaps, and from any other parts that could be emitting RF. The probes are usually connected to a spectrum analyzer. Scanning the probe over the surface of a PCB assembly or housing quickly identifies locations that emit electromagnetic radiation. By changing to a probe with smaller size, the origination of the emissions can be further narrowed down.
Additional applications are RF immunity tests by feeding an RF signal into the probe and radiating it into potentially susceptible circuit sections: Furthermore, the probes can be used in the field of repair or debugging to track down issues in RF signal chains by contactless measurement of RF signal levels. One more application is the non-invasive measurement of RF building blocks such as modulators or oscillators. Frequency, phase noise, and spectral components can be measured in conjunction with a low noise preamplifier.

EDN Review (EMC Blog from Kenneth Wyatt)

Elektronik Praxis EMC Pre Compliance Testing (in German)

The review starts at 27:22.

Example of using the near field probes for non-invasive RF measurement

EMI/EMC Testing: DSA815 w/ DIY Probes, TekBox Probes, TEM Cell

Another video from the EEV blog, starts are 19:10.

A review with our EMC probes and the Signalhound BB60C Spectrum Analyzer from the Signalpath, starts are 1:21.22.

Dave uses our H-Field probe to test a credit card RFID/NFC theft protection bag

Real-time near-field measurements with the RSA306B

Teardown & Repair of an Agilent N5182A MXG