TEM Cell (Closed Cell)

Transverse ElectroMagnetic (TEM) cell or Crawford cell (named after its inventor) is used to generate accurate electromagnetic waves over a wide frequency range: DC (0 Hz) to GHz. EM waves generated in the cell propagate in transverse mode and have the same characteristics as a plane wave. It can be used to calibrate E-field broadband probes for testing radiated E-field immunity as well as for measuring radiated emission from a product with a spectrum analyzer/EMI receiver.

Data Sheet

Filed vs. Power

Height vs. Frequency

Technical Note: Field Homogeneity

SPECIFICATIONS

Transverse ElectroMagnetic (TEM) cell or Crawford cell

(named after its inventor) is used to generate accurate electromagnetic waves over a wide frequency range: DC (0 Hz) to GHz. EM waves generated in the cell propagate in transverse mode and have the same characteristics as a plane wave. It can be used to calibrate E-field broadband probes for testing radiated E-field immunity as well as for measuring radiated emission from a product with a spectrum analyzer/EMI receiver. TEM cell generates a consistent electromagnetic field for testing small RF devices such as wireless pagers, receivers, portable phones, etc. An external test signal applied through the input port of the TEM cell generates a consistent and predictable (plane wave) test field inside the TEM cell. The radiation field emanating from a device (under test) located in the cell can also be detected through the signal generator port connected to an EMI receiver or a spectrum analyzer. The Equipment Under Test (EUT) is placed on the bottom ground plane as in Open Area Test Site (OATS) and in accordance with the shielded enclosure conditions. TEM cells are used in final compliance certification tests. There IEC 61000-4-3 EMC standard, require a TEM cell for radiated susceptibility and radiated emission tests. Integrated Circuits (IC), Micro-Electro-Mechanical Systems (MEMS) devices and PCBs can also be tested according to the standard SAE J1752-3.  TEM cells can deliver an equivalent OATS performance inside the comforts of a lab with minimum OATS errors. The main advantage of a TEM cell over a strip-line is that in the former, the EUT is completely shielded (except a window to insert/monitor the EUT) from the external environment, thus producing results with negligible errors. It is one of the reasons why a TEM cell is qualified to perform final compliance tests.

 

 

Technical Specifications

TEM 250

TEM 500

TEM 1000

TEM 3000

TEM 4000 (NEW)

Frequency range

DC-250 MHz

DC-500 MHz

DC-1GHz

DC-3GHz

DC-4GHz

Height under the plate

27 cm

14.7cm

7,3cm

2,35cm

2,35cm

Dimensions (LxWxH)

205x97x58cm

107x51x33.5cm

54x45x18cm

15x8x6cm

15x8x6cm

Max. Input power

1,6KW long term

1KW long term

750W long term

400W long term

400W long term

The field for a 25W amplifier

118V/m

350V/m

475V/m

1,4KV/m

1,4KV/m

Impedance

50 ohm

50 ohm

50 ohm

50 ohm

50 ohm

VSWR

<1.1

<1.1

<1.2

<1.2

<1.2

Return Loss

>25dB

>25dB

>20dB

>20dB

>20dB

Connector type

N

N

N

N or TNC, SMA

N or TNC, SMA

Weight

Approx. 40Kg

Approx. 20Kg.

Approx. 4,8Kg.

Approx. 1,6Kg.

Approx. 1,6Kg.

Options

Signal and power supply filter

* Can be equipped with a test setup for IC or PCB acc. to SAE J1752-3

 

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