These Open TEM-cells are well suited for immunity testing of small objects according to European (CE) and automotive standards (SAE J1113-25) or for biological experiments. The advantage of these OTEM cells is that they are open and it is very easy to control the functions of the EUT (Equipment Under Test). The applications are for instance the immunity testing of watches, pagers, telephones or PCB’s.
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Open TEM-cells are well suited for immunity testing of small objects according to European (CE) and automotive standards (SAE J1113-25) or for biological experiments. The advantage of these O-TEM cells is that they are open and it is very easy to control the functions of the EUT (Equipment Under Test). The applications are for instance the immunity testing of watches, pagers, telephones or PCB’s.In comparison with other closed TEM-cells, the price is low. The field decreases rapidly outside the Open TEM-cells (approx. 33 dB at 1 meter) and it is, therefore, possible to use an Open TEM-cell in ordinary facilities. Another interesting application is the calibration of field probes as the generated field inside the Open TEM-cell is very exact. Open TEM-cells are the most precise structures for field calibrations.
Technical Specifications |
O-TEM 250 |
O-TEM 500 |
O-TEM 1000 |
O-TEM 3000 |
Frequency range |
DC - 250 MHz |
DC - 500 MHz |
DC - 1 GHz |
DC - 3 GHz |
Height under the plate |
30 cm |
14.7 cm |
7.3 cm |
2.5 cm |
Dimensions (LxWxH) |
250x114x70 cm |
107x51x33.5 cm |
54x45x16.8 cm |
44x18x8 cm |
Max. Input power |
1.5 KW long term |
1 KW long term |
750 W long term |
400 W long term |
The field for a 25W amplifier |
105 V/m |
215 V/m |
480 V/m |
1.4 KV/m |
Impedance |
50 ohm |
50 ohm |
50 ohm |
50 ohm |
Wave impedance 377 Ω |
377 Ω |
377 Ω |
377 Ω |
377 Ω |
Connector type |
N |
N |
N |
N or TNC, SMA |
VSWR |
<1.1 |
<1.1 |
<1.2 |
<1.9 |
Field precision |
± 5 % |
± 5 % |
± 5 % |
± 5 % |
Weight |
Approx. 55Kg |
Approx. 12Kg. |
Approx. 3,5Kg. |
Approx. 3Kg. |
Options |
Signal and power supply filter, Dummy Load. |
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* Can be equipped with a test setup for IC or PCB acc. to SAE J1752-3 |