NEMP050 - Compact RS105 Test System < 50kV/m, 50 cm Height

NEMP050 - Compact RS105 Test System < 50kV/m, 50 cm Height

NEMP140 - Compact RS105 Test System < 50kV/m, 140 cm Height

NEMP140 - Compact RS105 Test System < 50kV/m, 140 cm Height

AS-CS115-CS116 TurnKey Test System for MIL-STD-461 CS115, CS116, CS114(option), & CS106(option)

AS-CS115-CS116 TurnKey Test System for MIL-STD-461 CS115, CS116, CS114(option), & CS106(option)

Products

NEMP050 - Compact RS105 Test System < 50kV/m, 50 cm Height

NEMP050 Radiated Susceptibility Test System

  • Compliance: Meets MIL-STD-461 RS105 standards for NEMP testing.
  • High Precision: Generates a minimum electric field of 50 kV/m, with higher fields available for smaller devices.
  • Portable Design: Tabletop Easy-to-move frame and compact setup for versatile placement.
  • User-Friendly: Controlled via computer with RS232 and USB interfaces.
  • Versatile Testing: Ideal for assessing small electronics like printed circuit boards and subsystems.
  • Robust Specifications: Quick rise time of 2.3 ns and pulse length of 23 ns, ensuring accurate and reliable results.

NEMP140 - Compact RS105 Test System < 50kV/m, 140 cm Height

NEMP140 Radiated Susceptibility Test System

  • Compliance: Meets MIL-STD-461 RS105 standards for NEMP testing.
  • High Precision: Generates a minimum electric field of 50 kV/m, with higher fields available for smaller devices.
  • Portable Design: Easy-to-move frame and compact setup for versatile placement.
  • User-Friendly: Controlled via computer with RS232 and USB interfaces.
  • Versatile Testing: Ideal for assessing small electronics like printed circuit boards and subsystems.
  • Robust Specifications: Quick rise time of 2.3 ns and pulse length of 23 ns, ensuring accurate and reliable results.

AS-CS115-CS116 TurnKey Test System for MIL-STD-461 CS115, CS116, CS114(option), & CS106(option)

  • Test System for MIL-STD-641 CS115, CS116, CS114(option) & CS106(option)
  • Automatic calibration for the whole test frequency range
  • Application of all test frequencies automatically. The level can be selected or automatic.
  • NO need to manually configure the measurement equipment
  • NO need to manually integrate the transfer function of probes and attenuators
  • Generation of test reports, NO need to record all values read from the measurement equipment
  • Generation of calibration reports, NO need to record all calibration setting parameters


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