Transient Generator

Motor-driven variable transformer, controlled by Multi-CE5 or Multi-CE7, used for power supply variation acc. to IEC 61000-4-11 and setting current for IEC 61000-4-8 Magnetic fields

Footswitch to trigger certain generator functions.

The Capacitive Coupling Clamp, EFTC 2012, provides the ability to couple Burst / EFT pulses to data lines. It can also be used for coupling to main lines where no CDN is available, for example, high current lines >200 A.

The capacitive Coupling-/Decoupling Networks CDN 5463/7463/10463/12463 are used in combination with the Multi-CE5 / Multi-CE7 or the Surge generators PG 7-250, PG 10-504, PG 12-804 and allow superimposition of surge and burst test pulses to the 3-phase mains voltage of the device under test.

Static Dissipation Brush is designed to meet section 7.2.4.1 of EN 61000-4-2: 2009. It is used to dissipate the charge on ungrounded equipment being tested. 

High-Voltage DC Test Sets HTS 20-10 are designed for testing dc dielectric strength of components, insulations, air- and surface flash-over gaps. Also for testing SPDs according to IEC 61643-1. The test voltage can be adjusted from 0.2 kV up to 20 kV. The test voltage rises like a ramp from zero to the selected test voltage. The rate of rise can be adjusted from 100 V/sec up to 10000 V/sec. Then the test voltage remains at the selected value for the test time, which can be adjusted from 1 – 1000 sec. Figure: incl. option PA503

HV - Impulse generators IPG 620, IPG 1050 and IPG 1272 create standard impulse voltages with waveform 1.2 / 50 µs acc. to IEC 60. The generators simulate surges caused by switching of inductive loads, power system switching, lightning strokes, etc. They are designed for testing of impulse dielectric strength of components, insulation, air-and surface flash-over gaps as well as for testing surge immunity of devices and systems acc. to CCITT - K22, ITU-T-K44. Picture: incl. option PA503

High-voltage pulse generator producing Ring Wave 0.5 µs / 100 kHz acc. to IEEE 587. The output peak voltage can be preset continuously from 0.2 - 7 kV. Rise time 0.5µs to the first peak, ringing frequency 100 kHz. A built-in voltage divider allows the monitoring of the output voltage waveform. The generator comprises an electronically regulated high-voltage power supply, an energy storage capacitor, a high-voltage/high-current switch, a pulse forming network and control- and monitoring unit. Moreover, the generator includes a Coupling-/Decoupling Network (CDN) for single-phase power supply lines.

The High-Voltage Pulse Generator IPG 255 is designed for testing of impulse dielectric strength of components, insulation, air-and surface flash-over gaps of watt-hour meters, static relays etc. according to IEC 60255, EN 61036, VDE 0435 part 303. Picture: incl. Option PA 503

High-Voltage Pulse Generators IPG 1218 / 1012 / 605 generate standard impulse voltages with waveform 1.2 / 50 µs acc. to IEC 60060. They are designed for testing impulse dielectric strength of components, insulations, air- and surface flash-over gaps acc. to IEC. The peak value of the test voltage is continuously adjustable from 0.2 - 6.25 / 10 / 12 kV. Positive or negative polarity of the output voltage can be selected. A built-in voltage divider 1000:1 allows monitoring of the impulse output waveform during testing.

High-Voltage Pulse Generator PG 12-400 generates standard impulse voltages with waveform 1.2 / 50 µs acc. to IEC 60060. It is designed for testing impulse dielectric strength of components, insulations, air- and surface flash-over gaps acc. to IEC.

The HV - Impulse generators IPG 2025 and IPG 2436 create standard impulse voltages with waveform 1.2 / 50 µs acc. to IEC 60060. They are designed for testing impulse dielectric strength of components, insulations, air- and surface flash-over gaps according to the standards. The peak value of the test voltage is continuously adjustable from 2 - 20 kV or 2 - 24 kV. Positive or negative polarity of output voltage can be selected. A built-in voltage divider 1000:1 allows monitoring of the impulse output waveform during testing.