Designed for applying the impulse output voltage of the Combination Wave Generator to interconnection lines of the equipment under test, acc. to IEC 61000-4-5, Fig10.
Designed for applying the impulse output voltage of the Combination wave/ Ring wave generator to interconnection lines of the equipment under test, acc. to IEC 61000-4-5, Fig9/ IEC 61000-4-12, Fig. 8.
The coupling/decoupling network CDN 504/ 508 U essentially consists of a current compensated decoupling inductor, L1 – L4/L8, and a set of coupling impedances to be inserted in the coupling path.
The capacitive Coupling-/Decoupling Network CDN 10216 & 12216 is used in combination with the Surge generators PG 7-250, PG 10-504 or PG 12-804 and allows superimposition of surge test pulses to the single-phase power supply voltage of the device under test. The test set-up is suitable for immunity testing of electronic systems and devices according to IEC 61000-4-4, IEC 61000-4-5 and IEEE 587.
The capacitive Coupling-/Decoupling Networks CDN 2402/2410 are used in combination with the Multi-CE5 and allows superimposition of surge and burst test pulses to up to four I/O signal lines. The test set-up is suitable for surge immunity testing of electronic systems and devices according to IEC 61000-4-4, IEC 61000-4-5 and IEEE 587.
The capacitive Coupling-/Decoupling Network CDN 2802 is used in combination with the Multi-CE5 & Multi-CE7 and allows superimposition of surge and burst test pulses to up to eight I/O signal lines.
The Trans Sense has been developed with EMC test laboratories in mind to enable a “go/no-go” verification of the transient generator output prior to the test.